Parameters
Vr [V] | 800 |
---|---|
Io [A] | 30.00 |
trr [nsec] | 80 |
Ifsm [A] | 500 |
Vf typ [V] | 1.45 |
Vf max [V] | 1.55 |
Ir typ [µA] | 10.00 |
Ir max [µA] | 100.00 |
Package | TO-254 |
Data Sheet | RU0073D.PDF |
Features
• Soft Recovery Diode
• Ultrafast Recovery: 80 nsec maximum
• Available in faster recovery versions
• High Surge Rating
• Low Reverse Leakage Current
• Low Junction Capacitance
• Hermetically Sealed Package
• Gold Eutectic Die Attach available
• Ultrasonic Aluminum Wire Bonds
• Ceramic Seals for improved Hermeticity available
• TX, TXV, and S Level Screening Available
• Ultrafast Recovery: 80 nsec maximum
• Available in faster recovery versions
• High Surge Rating
• Low Reverse Leakage Current
• Low Junction Capacitance
• Hermetically Sealed Package
• Gold Eutectic Die Attach available
• Ultrasonic Aluminum Wire Bonds
• Ceramic Seals for improved Hermeticity available
• TX, TXV, and S Level Screening Available